Hitachi EEM View CMOS camera imaging system for Fluorescence Spectrophotometer

EEM® View CMOS camera imaging system for Fluorescence Spectrophotometer

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EEM View is a completely new concept system in the world which delivers fluorescence, reflection spectra and these images simultaneously. To make it possible, AI technology is applied to analyze data with a special algorithm. This measurement is possible by installing the EEM View Accessory on the F-7000 / 7100 Fluorescent Spectrophotometer.

What is EEM view?

New technology capable of capturing fluorescence and reflection images and spectra of a sample simultaneously.

• Measurement of spectrum data for samples (spectral and fluorescence properties).
• Captures images under white light or monochromatic light (area: Φ20 mm, wavelength range: 380 to 700 nm)
• Displays separated fluorescence and reflection images obtained using an analysis algorithm that applies AI technology
• Displays spectra for each partition in an image (fluorescence spectrum and reflection spectrum)

OVERVIEW

- Fluorescence Spectrophotometer equipped with CMOS camera imaging system - Uniform illumination system using an integrating sphere.

• Captures fluorescence and reflection images and spectra of samples simultaneously!
• Diffusion of illumination using integrating sphere
• Highly uniform illumination of samples
• Dual detection using fluorescence spectroscope and CMOS camera
• A spectrofluorometric microscope is an option that can be attached to the sample chamber of the existing Model F-7100 fluorescence spectrophotometer equipped with CMOS camera.
• Simple mounting which supports many types of samples!

SPECIFICATIONS

* Main specifications for the photometer conform to those of the fluorescence spectrophotometer main unit.

FUNCTION

*1 The spectral analysis algorithm was developed in joint research by Professor Imari SATO and Associate Professor Yinqiang ZHENG of the National Institute of Informatics.

Example of configuration